Exact characterization of up to three cut cells with one flash. Providing individual measurement data sets for each cut cell.

  • Independent IV-Data Management for each cut-cell

  • Individual data binning and defect detection for each cut cell

  • Aimultaneous characterization of up to three cut cells under one flash

  • Works with all solar cell types currently available. Being an upgrade feature for our SINUS family, it is even ready for HJT cells

  • Accelerated cut-cell measurement for new production lines or as drop-in upgrade

LED’s GET IN TOUCH FOR FASTER AND MORE ACCURATE CUT-CELL MEASUREMENT!

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