HARDWARE OPTIONS

Cut-Cell Measurement (CCM)

With the upgrade of WAVELABS’ I-V measurement system as well as the extension of the GUI, it is now possible to measure the I-V characteristics of 1, 2 or 3 cut cells simultaneously during the same flash.

Use case

  • Simultaneous measurement for up to 3 cut cells in one single measurement cycle

  • Increased yield due to galvanically-isolated separate measurement of I-V characteristics during same light flash

  • Individual data binning and defect detection for each cut cell

Technical highlights

  • Independent I-V data management for each cut cell

  • Extension of data interface to automation or manufacturing execution system for data binning and data analysis

  • Same performance data, e.g. repeatability and accuracy, as for the conventional single channel I-V measurement system

  • Adjustment of line resistance and intensity calibration per position possible

  • Compatible with EL and IR measurement

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Cut-Cell Measurement (CCM) is available for:

SINUS-360 PRO

SINUS-360 PRO

SINUS-360 ADVANCED

SINUS-360 ADVANCED

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