HARDWARE OPTIONS
Infrared (IR) imaging
Infrared (IR) imaging
Infrared (IR) imaging is fully integrated into the SINUS-360 PRO/ADVANCED as a powerful automatic optical inspection (AOI) option defining additional quality parameters for end- of-line (EOL) binning, alarming and immediate processing control. The option enables cell manufacturers to market 100% hot-spot-tested solar cells and help secure power plant yields and safety.
Sample images
Selection of typical hot-spot defects showing up in IR imaging: